Design of an Inertially Counterbalanced $Z$ -Nanopositioner for High-Speed Atomic Force Microscopy
نویسندگان
چکیده
منابع مشابه
A serial-kinematic nanopositioner for high-speed atomic force microscopy.
A flexure-guided serial-kinematic XYZ nanopositioner for high-speed Atomic Force Microscopy is presented in this paper. Two aspects influencing the performance of serial-kinematic nanopositioners are studied in this work. First, mass reduction by using tapered flexures is proposed to increased the natural frequency of the nanopositioner. 25% increase in the natural frequency is achieved due to ...
متن کاملHigh-speed atomic force microscopy.
High-speed atomic force microscopy (HS-AFM) has been developed as a nano-dynamics visualization technique. This microscopy permits direct observation of structure dynamics and dynamic processes of biological molecules in physiological solutions, at a subsecond to sub-100 ms temporal resolution and an ∼2 nm lateral and a 0.1 nm vertical resolution. Importantly, tip-sample interactions do not dis...
متن کاملComponents for high speed atomic force microscopy.
Many applications in materials science, life science and process control would benefit from atomic force microscopes (AFM) with higher scan speeds. To achieve this, the performance of many of the AFM components has to be increased. In this work, we focus on the cantilever sensor, the scanning unit and the data acquisition. We manufactured 10 microm wide cantilevers which combine high resonance ...
متن کاملHigh-speed cycloid-scan atomic force microscopy.
A key hurdle in achieving high scan speeds in atomic force microscopes is that the probe is required to be scanned over the sample in a zig-zag raster pattern. The fast axis of the AFM scanner must track a signal that contains frequencies beyond its mechanical bandwidth. Consequently, fast raster scans generate distortions in the resulting image. We propose a smooth cycloid-like scan pattern th...
متن کاملDesign of a compact serial-kinematic scanner for high-speed atomic force microscopy: an analytical approach
A systematic procedure for designing a high-speed, compact serial-kinematic XYZ scanner for atomic force microscopy is presented in this Letter. Analytical stiffness calculations are used to estimate the first natural frequency and travel range of the scanner. Design and characterisation of the scanner are presented. Results of finite-element analysis and experimentation on the scanner revealed...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEE Transactions on Nanotechnology
سال: 2013
ISSN: 1536-125X,1941-0085
DOI: 10.1109/tnano.2012.2233749